PEEM
Photo Emission
Electron Microscopy |
PEEM
System |
oval and
chemical
defects on GaAs |
integrated
circuit |
YBaCuO
superconductor |
passivated
InP |
layer deposited
by abblation |
chemical image
of InP |
crystal phases
on YBaCuO |
growth defect
on YBaCuO |
test
pattern |
large defect
on GaAs |
stressed
GaAs |
integrated
circuit |
|